IR emitter non-uniformity correction (NUC): making sense of the data

Jim Oleson; Derek Greer

doi:10.1117/12.883450

9 May 2011 IR emitter non-uniformity correction (NUC): making sense of the data

Jim Oleson, Derek Greer

Proceedings Volume 8015, Technologies for Synthetic Environments: Hardware-in-the-Loop XVI; 801502 (2011) https://doi.org/10.1117/12.883450
Event: SPIE Defense, Security, and Sensing, 2011, Orlando, Florida, United States

Abstract

Several organizations in the government and industry are actively developing IR emitter array nonuniformity correction (NUC) algorithms. While significant effort has been expended and progress has been made, there are no standard and comprehensive metrics for describing post NUC emitter nonuniformity. Subsequently, the nonuniformity data reported by one organization may not be comparable with data from another. Further, the sigma/mean uniformity values typically reported do not shed light on fixed pattern noise such as row and column offsets. As a result, NUC reporting often does not give a customer adequate insight into the value of emitter nonuniformity correction. This paper offers standard metrics for measuring and reporting IR emitter array nonuniformity. The metrics established here allow data from one measuring organization to be directly compared with that of another. Further, more practical aspects of nonuniformity correction are addressed which shed light on issues such as fixed pattern noise (FPN), emission gradients and other undesirable artifacts. Data analysis techniques described in this paper demonstrate the new metrics and their descriptive role in the NUC process. The NUC parameters established here characterize the ability of IR emitter arrays to accurately represent terrestrial scenes as well as hot objects and gases. This paper also explores areas in the emitter dynamic range that provide special challenges for generating a NUC table and their influence in the selection of nonuniformity correction radiance levels.

Citation Download Citation

Jim Oleson and Derek Greer "IR emitter non-uniformity correction (NUC): making sense of the data", Proc. SPIE 8015, Technologies for Synthetic Environments: Hardware-in-the-Loop XVI, 801502 (9 May 2011); https://doi.org/10.1117/12.883450

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available