Paper
1 January 1987 Some Observations On Tool Sharpness And Sub-Surface Damage In Single Point Diamond Turning
C. Evans, R. Polvani, M. Postek, R. Rhorer
Author Affiliations +
Proceedings Volume 0802, In-Process Optical Metrology for Precision Machining; (1987) https://doi.org/10.1117/12.967102
Event: Fourth International Symposium on Optical and Optoelectronic Applied Sciences and Engineering, 1987, The Hague, Netherlands
Abstract
Simple techniques for an assessment of the depth and intensity of plastic work, or sub-surface damage, in single point diamond turned components are described. Based on microhardness measurement techniques, the approach outlined here gives good qualitative correlation with conventional metallographic approaches for sub-surface damage assessment. Some data indicating variation of sub-surface damage with changing process parameters is presented; the aim of the paper, however, is to outline possible test methods and stimulate discussion. Possible approaches to measurement of tool sharpness are also discussed, again with the aim of eliciting comments.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
C. Evans, R. Polvani, M. Postek, and R. Rhorer "Some Observations On Tool Sharpness And Sub-Surface Damage In Single Point Diamond Turning", Proc. SPIE 0802, In-Process Optical Metrology for Precision Machining, (1 January 1987); https://doi.org/10.1117/12.967102
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Cited by 21 scholarly publications.
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KEYWORDS
Diamond

Scanning tunneling microscopy

Copper

Surface finishing

Polishing

Diamond turning

Scanning electron microscopy

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