Development of simple algorithm for direct and rapid determination of cotton maturity from FT-IR spectroscopy

Yongliang Liu; Devron Thibodeaux; Gary R. Gamble

doi:10.1117/12.883025

12 May 2011 Development of simple algorithm for direct and rapid determination of cotton maturity from FT-IR spectroscopy

Yongliang Liu, Devron Thibodeaux, Gary R. Gamble

Author Affiliations +

Proceedings Volume 8032, Next-Generation Spectroscopic Technologies IV; 803210 (2011) https://doi.org/10.1117/12.883025
Event: SPIE Defense, Security, and Sensing, 2011, Orlando, Florida, United States

Abstract

Fourier transform infrared (FT-IR) spectra of seed and lint cottons were collected to explore the potential for the discrimination of immature cottons from mature ones and also for the determination of actual cotton maturity. Spectral features of immature and mature cottons revealed large differences in the 1200-900 cm^-1 region, and such spectral distinctions formed the basis on which to develop simple three-band ratio algorithm for classification analysis. Next, an additional formula was created to assess the degree of cotton fiber maturity by converting the three-band ratios into an appropriate FT-IR maturity (MIR) index. Furthermore, the MIR index was compared with parameters derived from traditional image analysis (IA) and advanced fiber information system (AFIS) measurements. Results indicated strong correlations (R² > 0.89) between M_IR and M_AFIS and between M_IR and M_IA among either International Cotton Calibration (ICC) standards or selected cotton maturity references. On the other hand, low correlations between the pairs were observed among regular cotton fibers, which likely resulted from the heterogeneous distribution of structural, physical, and chemical characteristics in cotton fibers and subsequent different sampling specimens for individual and independent measurement.

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Yongliang Liu, Devron Thibodeaux, and Gary R. Gamble "Development of simple algorithm for direct and rapid determination of cotton maturity from FT-IR spectroscopy", Proc. SPIE 8032, Next-Generation Spectroscopic Technologies IV, 803210 (12 May 2011); https://doi.org/10.1117/12.883025

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