Application issues in the use of depth from (de)focus analysis methods

M. Daneshpanah; G. Abramovich; K. Harding; A. Vemury

doi:10.1117/12.886271

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19 May 2011 Application issues in the use of depth from (de)focus analysis methods

M. Daneshpanah, G. Abramovich, K. Harding, A. Vemury

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Proceedings Volume 8043, Three-Dimensional Imaging, Visualization, and Display 2011; 80430G (2011) https://doi.org/10.1117/12.886271
Event: SPIE Defense, Security, and Sensing, 2011, Orlando, Florida, United States

Abstract

Recovering 3D object information through analyzing image focus (or defocus) has been shown to be a potential tool in situations where only a single viewing point is possible. Precise modeling and manipulation of imaging system parameters, e.g. depth of field, modulation transfer function and sensor characteristics, as well as lighting condition and object surface characteristics are critical for effectiveness of such methods. Sub-optimal performance is achieved when one or more of these parameters are dictated by other factors. In this paper, we will discuss the implicit requirements imposed by most common depth from focus/defocus (DFF/DFD) analysis methods and offer related application considerations. We also describe how a priori information about the objects of interest can be used to improve performance in realistic applications of this technology.

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M. Daneshpanah, G. Abramovich, K. Harding, and A. Vemury "Application issues in the use of depth from (de)focus analysis methods", Proc. SPIE 8043, Three-Dimensional Imaging, Visualization, and Display 2011, 80430G (19 May 2011); https://doi.org/10.1117/12.886271

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