Translator Disclaimer
Paper
24 May 2011 Extremely lightweight x-ray optics based on thin substrates
Author Affiliations +
Abstract
We report on recent progress with development of astronomical X-ray optics based on bent Si wafers. Recent efforts with Si wafers have been focused on new forming technologies such as method of deposition of thin layers. The role of substrates quality in performance of final mirror arrays, as required by large future space X-ray astronomy experiments was also studied.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. Hudec, J. Sik, M. Lorenc, L. Pina, V. Marsikova, M. Mika, A. Inneman, and M. Skulinova "Extremely lightweight x-ray optics based on thin substrates", Proc. SPIE 8076, EUV and X-Ray Optics: Synergy between Laboratory and Space II, 807604 (24 May 2011); https://doi.org/10.1117/12.890516
PROCEEDINGS
9 PAGES


SHARE
Advertisement
Advertisement
RELATED CONTENT

Novel applications of silicon pore optics technology
Proceedings of SPIE (September 17 2012)
Advanced x-ray optics with Si wafers and slumped glass
Proceedings of SPIE (August 31 2009)
Novel design of a large x ray optical system for...
Proceedings of SPIE (October 15 2012)
Progress in x ray optics development with formed glass and...
Proceedings of SPIE (September 20 2007)
Recent progress with x ray optics based on Si wafers...
Proceedings of SPIE (July 15 2008)
Novel x-ray optics with Si wafers and formed glass
Proceedings of SPIE (June 13 2006)
Back-up technologies for IXO
Proceedings of SPIE (April 30 2009)

Back to Top