Paper
18 May 2011 FEL multilayer optics damaged by multiple shot laser beam: experimental results and discussion
A. Giglia, N. Mahne, A. Bianco, C. Svetina, R. Cucini, L. Vysin, T. Burian, L. Juha, S. Nannarone
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Abstract
The irradiation effects of multiple ultrafast shots of laser beams with estimated fluences of some tens of mJ/cm2 on a EUV Mo/Si multilayer have been studied. Irradiation damage has been induced by multiple shots of two different lasers (100 fs 400 nm the first, 1.5 ns 46.9 nm the second). The study has been motivated by the need of multilayer Mo/Si optics for the delay lines of the FEL source FERMI@Elettra, where these mirrors will be used to reflect 100 fs pulses at 13 nm with a fluence of some mJ/cm2. The analysis has been performed by means of different techniques as EUV and soft X-ray reflectivity, XPS, and Standing wave enhanced XPS. Simulations have been carried on by means of an indigenously developed software OPAL (Optical Properties of Anisotropic Layers) for the calculation of the absorbed energy by the stratified medium. AFM and SEM surface images have been also acquired. In the irradiation at 400 nm, we observed a significant change in the multilayer performance at fluences of 100 mJ/cm2 and above with a significant reduction of reflectivity. Spectroscopic analysis allowed to correlate the decrease of reflectivity with the degradation of the multilayer stacking, ascribed to Mo-Si intermixing at the Mo/Si interfaces of the first few layers, close to the surface of the mirror. Preliminary tests have been also performed on the sample irradiated at 46.9 nm.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. Giglia, N. Mahne, A. Bianco, C. Svetina, R. Cucini, L. Vysin, T. Burian, L. Juha, and S. Nannarone "FEL multilayer optics damaged by multiple shot laser beam: experimental results and discussion", Proc. SPIE 8077, Damage to VUV, EUV, and X-ray Optics III, 807711 (18 May 2011); https://doi.org/10.1117/12.886845
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KEYWORDS
Molybdenum

Reflectivity

Silicon

Extreme ultraviolet

Silica

Interfaces

Free electron lasers

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