Novel method for misalignments measurement on imaging systems through quality image analysis

Esther Oteo; José Fernández-Dorado; J. Arasa; P. Blanco; C. Pizarro

doi:10.1117/12.889248

27 May 2011 Novel method for misalignments measurement on imaging systems through quality image analysis

Esther Oteo, José Fernández-Dorado, J. Arasa, P. Blanco, C. Pizarro

Proceedings Volume 8082, Optical Measurement Systems for Industrial Inspection VII; 80823C (2011) https://doi.org/10.1117/12.889248
Event: SPIE Optical Metrology, 2011, Munich, Germany

Abstract

The proper alignment of the individual elements in an optical system is a crucial point in the final performance of an optical system. The developed method we present is aimed to detect and quantify misalignments of decentering and tilt in imaging optical systems with a non-expensive system. This method is based in the comparison of different image parameters values. These parameters values are obtained through the analysis of the image formed by the optical system under study of an object composed of an array of point sources. The method has been validated by obtaining the behavior curves of the parameters for a gauss system in front of decentering up to 0.3mm and tilt up to 1°.

Citation Download Citation

Esther Oteo, José Fernández-Dorado, J. Arasa, P. Blanco, and C. Pizarro "Novel method for misalignments measurement on imaging systems through quality image analysis", Proc. SPIE 8082, Optical Measurement Systems for Industrial Inspection VII, 80823C (27 May 2011); https://doi.org/10.1117/12.889248

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