Paper
20 June 2011 Wide-band IR imaging in the NIR-MIR-FIR regions for in situ analysis of frescoes
C. Daffara, L. Pezzati, D. Ambrosini, D. Paoletti, R. Di Biase, P. I. Mariotti, C. Frosinini
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Abstract
Imaging methods offer several advantages in the field of conservation allowing to perform non-invasive inspection of works of art. In particular, non-invasive techniques based on imaging in different infrared (IR) regions are widely used for the investigation of paintings. Using radiation beyond the visible range, different characteristics of the inspected artwork may be revealed according to the bandwidth acquired. In this paper we present the recent results of a joint project among the two research institutes DIMEG and CNR-INO, and the restoration facility Opificio delle Pietre Dure, concerning the wide-band integration of IR imaging techniques, in the spectral ranges NIR 0.8-2.5 μm, MIR 3-5 μm, and FIR 8-12 μm, for in situ analysis of artworks. A joint, multi-mode use of reflection and thermal bands is proposed for the diagnostics of mural paintings, and it is demonstrated to be an effective tool in inspecting the layered structure. High resolution IR reflectography and, to a greater extent, IR imaging in the 3-5 μm band, are effectively used to characterize the superficial layer of the fresco and to analyze the stratigraphy of different pictorial layers. IR thermography in the 8-12 μm band is used to characterize the support deep structure. The integration of all the data provides a multi- layered and multi-spectral representation of the fresco that yields a comprehensive analysis.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
C. Daffara, L. Pezzati, D. Ambrosini, D. Paoletti, R. Di Biase, P. I. Mariotti, and C. Frosinini "Wide-band IR imaging in the NIR-MIR-FIR regions for in situ analysis of frescoes", Proc. SPIE 8084, O3A: Optics for Arts, Architecture, and Archaeology III, 808406 (20 June 2011); https://doi.org/10.1117/12.889891
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Cited by 12 scholarly publications.
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KEYWORDS
Infrared imaging

Near infrared

Thermography

Reflectivity

Reflection

Diagnostics

Inspection

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