Sub-wavelength imaging using stacks of metallic meander structures with different periodicities

Philipp Schau; Karsten Frenner; Liwei Fu; Wolfgang Osten; Heinz Schweizer; Harald Giessen

doi:10.1117/12.893389

9 September 2011 Sub-wavelength imaging using stacks of metallic meander structures with different periodicities

Philipp Schau, Karsten Frenner, Liwei Fu, Wolfgang Osten, Heinz Schweizer, Harald Giessen

Proceedings Volume 8093, Metamaterials: Fundamentals and Applications IV; 80931K (2011) https://doi.org/10.1117/12.893389
Event: SPIE NanoScience + Engineering, 2011, San Diego, California, United States

Abstract

Two resonant surfaces, which allow the propagation of surface plasmon polaritons (SPPs) can mimic negative index materials (NIM). Hence, it is possible to recreate the near-field imaging effects known from Pendry's perfect lens. The metallic meander structure is a well-suited candidate for such a resonant surface due to the excitation and tunability of the short (SRSPP) and long range surface plasmon (LRSPP) frequencies. Furthermore, the Fano-type pass band between the SRSPP and LRSPP frequencies of a single meander sheet retains its dominant role when being stacked. We demonstrate how a stack consisting of two meander structures can perfectly image within this pass band region and propose a stack of meander structures with successively increasing periodicity. Such a stack might be capable to decrease the lateral wave vector until near-field to far-field transformation is achieved. The frequency shift of the pass band for each sheet can be compensated by changing other geometrical parameters. We rigorously calculate the spectra of various meander designs and show that meander stacks transfer energy resonantly over large distances with a high transmission.

Citation Download Citation

Philipp Schau, Karsten Frenner, Liwei Fu, Wolfgang Osten, Heinz Schweizer, and Harald Giessen "Sub-wavelength imaging using stacks of metallic meander structures with different periodicities", Proc. SPIE 8093, Metamaterials: Fundamentals and Applications IV, 80931K (9 September 2011); https://doi.org/10.1117/12.893389

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