Origin of dielectric tunability in DNA-CTMA film at microwave frequencies

Roberto S. Aga Jr.; Carrie M. Bartsch; Brian A. Telek; Guru Subramanyam; Emily M. Heckman; James G. Grote

doi:10.1117/12.896483

23 September 2011 Origin of dielectric tunability in DNA-CTMA film at microwave frequencies

Roberto S. Aga Jr., Carrie M. Bartsch, Brian A. Telek, Guru Subramanyam, Emily M. Heckman, James G. Grote

Proceedings Volume 8103, Nanobiosystems: Processing, Characterization, and Applications IV; 81030L (2011) https://doi.org/10.1117/12.896483
Event: SPIE NanoScience + Engineering, 2011, San Diego, California, United States

Abstract

DNA-CTMA is an attractive material to explore for reconfigurable optical and electronic devices. Its dielectric constant at microwave frequencies can be tuned by applying a DC electric field. In this work, the origin of dielectric tunability and other ferroelectric-like behavior observed in DNA-CTMA films is investigated. Results suggest that the dominant polarization mechanism is ionic in nature and is caused by intentionally retaining excess ions in the DNA-CTMA precipitate during processing.

Citation Download Citation

Roberto S. Aga Jr., Carrie M. Bartsch, Brian A. Telek, Guru Subramanyam, Emily M. Heckman, and James G. Grote "Origin of dielectric tunability in DNA-CTMA film at microwave frequencies", Proc. SPIE 8103, Nanobiosystems: Processing, Characterization, and Applications IV, 81030L (23 September 2011); https://doi.org/10.1117/12.896483

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