Phase Measuring Interferometry With A Tunable Semiconductor Laser

Y. Ishii; J. Chen; K. Murata

doi:10.1117/12.967128

1 January 1987 Phase Measuring Interferometry With A Tunable Semiconductor Laser

Y. Ishii, J. Chen, K. Murata

Proceedings Volume 0813, Optics and the Information Age; (1987) https://doi.org/10.1117/12.967128
Event: 14th Congress of the International Commission for Optics, 1987, Quebec, Canada

Abstract

Several authors1'2) have developed a digital heterodyne or a fringe-scanning interferometry employing the phase shifter such as a piezoelectric transducer (PZT). Recently semiconductor lasers (LD's) are usable and potentially reliable for key devices in optics. One of the features of LD is tunability, in which the wavelength of a single-mode laser can be changed continuously by the variation of the injection current and/or the temperature of active region. Therefore, it is possible to consider that a phase measuring interferometry can be realized by changing the relative phase difference between the two beams of the interferometer with the frequency modulation of

Citation Download Citation

Y. Ishii, J. Chen, and K. Murata "Phase Measuring Interferometry With A Tunable Semiconductor Laser", Proc. SPIE 0813, Optics and the Information Age, (1 January 1987); https://doi.org/10.1117/12.967128

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