Metrology of IXO mirror segments

Kai-Wing Chan; Melinda Hong; Timo Saha; William Zhang

doi:10.1117/12.894347

11 October 2011 Metrology of IXO mirror segments

Kai-Wing Chan, Melinda Hong, Timo Saha, William Zhang

Proceedings Volume 8147, Optics for EUV, X-Ray, and Gamma-Ray Astronomy V; 814716 (2011) https://doi.org/10.1117/12.894347
Event: SPIE Optical Engineering + Applications, 2011, San Diego, California, United States

Abstract

For future x-ray astrophysics mission that demands optics with large throughput and excellent angular resolution, many telescope concepts build around assembling thin mirror segments in a Wolter I geometry, such as that originally proposed for the International X-ray Observatory. The arc-second resolution requirement posts unique challenges not just for fabrication, mounting but also for metrology of these mirror segments. In this paper, we shall discuss the metrology of these segments using normal incidence metrological method with interferometers and null lenses. We present results of the calibration of the metrology systems we are currently using, discuss their accuracy and address the precision in measuring near-cylindrical mirror segments and the stability of the measurements.

Citation Download Citation

Kai-Wing Chan, Melinda Hong, Timo Saha, and William Zhang "Metrology of IXO mirror segments", Proc. SPIE 8147, Optics for EUV, X-Ray, and Gamma-Ray Astronomy V, 814716 (11 October 2011); https://doi.org/10.1117/12.894347

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