Alignment and characterization of high uniformity imaging spectrometers

Holly A. Bender; Pantazis Mouroulis; Michael L. Eastwood; Robert O. Green; Sven Geier; Eric B. Hochberg

doi:10.1117/12.892798

Translator Disclaimer

6 September 2011 Alignment and characterization of high uniformity imaging spectrometers

Holly A. Bender, Pantazis Mouroulis, Michael L. Eastwood, Robert O. Green, Sven Geier, Eric B. Hochberg

Author Affiliations +

Proceedings Volume 8158, Imaging Spectrometry XVI; 81580J (2011) https://doi.org/10.1117/12.892798
Event: SPIE Optical Engineering + Applications, 2011, San Diego, California, United States

Abstract

Imaging spectrometers require precise adjustments, in some cases at the sub-micrometer level, in order to achieve a uniform response over both the spectral and spatial dimensions. We describe a set of measurement techniques and their corresponding alignment adjustments to achieve the 95% or higher uniformity specifications required for Earthobserving imaging spectrometers. The methods are illustrated with measurements from the Next Generation Imaging Spectrometer system that has been built at the Jet Propulsion Laboratory, California Institute of Technology, under contract with the National Aeronautics and Space Administration.

Citation Download Citation

Holly A. Bender, Pantazis Mouroulis, Michael L. Eastwood, Robert O. Green, Sven Geier, and Eric B. Hochberg "Alignment and characterization of high uniformity imaging spectrometers", Proc. SPIE 8158, Imaging Spectrometry XVI, 81580J (6 September 2011); https://doi.org/10.1117/12.892798

ACCESS THE FULL ARTICLE