Interferometric Testing Technology Developments And Applications In Japan

Toyohiko Yatagai

doi:10.1117/12.941756

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23 March 1987 Interferometric Testing Technology Developments And Applications In Japan

Toyohiko Yatagai

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Proceedings Volume 0816, Interferometric Metrology; (1987) https://doi.org/10.1117/12.941756
Event: 31st Annual Technical Symposium on Optical and Optoelectronic Applied Sciences and Engineering, 1987, San Diego, CA, United States

Abstract

Research efforts for interferometric techniques and their applications in Japan are reviewed with an emphasis on recent developments. We will describe briefly digital fringe analysis techniques and theoretical approaches to precision phase analysis, and then practical applications of novel interferometers, holography, moire topography and optical fiber interferometry.

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Toyohiko Yatagai "Interferometric Testing Technology Developments And Applications In Japan", Proc. SPIE 0816, Interferometric Metrology, (23 March 1987); https://doi.org/10.1117/12.941756

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