THz/sub-THz detector based on electrons and holes heating by electromagnetic wave propagating along Hg1-xCdxTe layer

F. Sizov; V. Zabudsky; V. Dobrovolsky; N. Momot; Z. Tsybrii; M. Apats'ka; M. Smoliy; N. Dmytruk; S. Bunchuk; N. Mikhailov; V. Varavin

doi:10.1117/12.896580

22 September 2011 THz/sub-THz detector based on electrons and holes heating by electromagnetic wave propagating along Hg_1-xCd_xTe layer

F. Sizov, V. Zabudsky, V. Dobrovolsky, N. Momot, Z. Tsybrii, M. Apats'ka, M. Smoliy, N. Dmytruk, S. Bunchuk, N. Mikhailov, V. Varavin

Author Affiliations +

Proceedings Volume 8167, Optical Design and Engineering IV; 816728 (2011) https://doi.org/10.1117/12.896580
Event: SPIE Optical Systems Design, 2011, Marseille, France

Abstract

Direct detection thin-film bipolar narrow-gap Hg_1-xCd_xTe semiconductor is considered as a waveguide THz/sub-THz bolometer. The response of such thin layer detectors was calculated and measured in ν=0.037-1.54 THz frequency range at T~70-300 K. Noise equivalent power of such detectors can reach NEP_300K~4×10^-10 W/Hz^1/2 and NEP_100K~10^-11 in sub-THz frequency range.

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F. Sizov, V. Zabudsky, V. Dobrovolsky, N. Momot, Z. Tsybrii, M. Apats'ka, M. Smoliy, N. Dmytruk, S. Bunchuk, N. Mikhailov, and V. Varavin "THz/sub-THz detector based on electrons and holes heating by electromagnetic wave propagating along Hg_1-xCd_xTe layer", Proc. SPIE 8167, Optical Design and Engineering IV, 816728 (22 September 2011); https://doi.org/10.1117/12.896580

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