Paper
23 August 2011 Photoinduced effect in Te-As-Se thin films for photonic applications
R. Chauhan, A. K. Srivastava, A. Tripathi, M. Mishra, K. K. Srivastava
Author Affiliations +
Proceedings Volume 8173, Photonics 2010: Tenth International Conference on Fiber Optics and Photonics; 81731C (2011) https://doi.org/10.1117/12.899994
Event: International Conference on Fiber Optics and Photonics, 2010, Guwahati, India
Abstract
Amorphous TexAs40Se60-x (x = 0, 10) thin films were prepared using thermal evaporation technique onto cleaned glass substrate at room temperature, and then exposed to UV-VIS light (having accordance with ASTM standards CIE 85 Table 4) using a Xenon lamp for two hours duration. Thicknesses of the films were measured using a stylus based surface profilometer. Structural analysis of the films was done using XRD measurements. Optical changes under UVVIS exposure were investigated by UV/VIS spectroscopy in wavelength range 300~900 nm. Changes in optical parameters are proposed for environmental monitoring applications. These results are compared with other range of photoexposures for some different Te-As-Se compositions in order to analyze their usability for various photonic applications.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. Chauhan, A. K. Srivastava, A. Tripathi, M. Mishra, and K. K. Srivastava "Photoinduced effect in Te-As-Se thin films for photonic applications", Proc. SPIE 8173, Photonics 2010: Tenth International Conference on Fiber Optics and Photonics, 81731C (23 August 2011); https://doi.org/10.1117/12.899994
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KEYWORDS
Thin films

Absorption

Glasses

Environmental monitoring

Tellurium

Thermography

Transparency

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