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13 October 2011 Proximal and point detection of contaminated surfaces using Raman spectroscopy
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We are actively investigating the use of Raman spectroscopy for proximal standoff detection of chemicals and explosive materials on surfaces. These studies include Raman Chemical Imaging of contaminated fingerprints for forensic attribution and the assessments of commercial handheld or portable Raman instruments operating with near-infrared (IR) as well as ultraviolet (UV) laser excitation specifically developed for on-the-move reconnaissance of chemical contamination. As part of these efforts, we have measured the Raman cross sections of chemical agents, toxic industrial chemicals, and explosives from the UV to NIR. We have also measured and modeled the effect interrogation angle has on the Raman return from droplets on man-made surfaces. Realistic droplet distributions have been modeled and tested against variations in surface scan patterns and laser spot size for determining the optimum scan characteristics for detection of relevant surface contamination.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jason A. Guicheteau, Steven D. Christesen, Ashish Tripathi, Erik D. Emmons, Phillip G. Wilcox, Darren K. Emge, Ian J. Pardoe, and Augustus W. Fountain III "Proximal and point detection of contaminated surfaces using Raman spectroscopy", Proc. SPIE 8189, Optics and Photonics for Counterterrorism and Crime Fighting VII; Optical Materials in Defence Systems Technology VIII; and Quantum-Physics-based Information Security, 818902 (13 October 2011);

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