Luminescence of different surface flaws in high purity silica glass under UV excitation

J. Fournier; J. Néauport; P. Grua; V. Jubera; E. Fargin; D. Talaga; S. Jouannigot

doi:10.1117/12.899177

28 November 2011 Luminescence of different surface flaws in high purity silica glass under UV excitation

J. Fournier, J. Néauport, P. Grua, V. Jubera, E. Fargin, D. Talaga, S. Jouannigot

Proceedings Volume 8190, Laser-Induced Damage in Optical Materials: 2011; 819021 (2011) https://doi.org/10.1117/12.899177
Event: SPIE Laser Damage, 2011, Boulder, Colorado, United States

Abstract

Photoluminescence excited by 325 nm laser light is used to investigate defect populations existing in different surface flaws in high purity fused silica and to achieve a better understanding of laser damage mechanisms. Luminescence bands peaking at 1.9, 2.1, 2.3, 2.7 and 3.1 eV have been detected in the spectral area ranging from 1.6 up to 3.6 eV. According to the literature, the 2.3 eV band would be due to STE's (Self Trapped Excitons) relaxation. In order to study this hypothesis, temperature dependent experiments have been driven in the 90 K-300 K range. For indentations as well as laser damage, we show the evolution of luminescence spectra with temperature. Contrarily to the well known behavior of STE's, which shows a change of several orders of magnitude for luminescence intensity, the 2.3 eV band is weakly influenced by temperature decrease, from the ambient down to 90 K. The Gaussian decomposition of spectra allows dividing the five luminescence bands in two categories. The first one corresponds to bands showing a significant intensity enhancement with temperature decrease, and the second one to bands remaining insensitive to the fall in temperature. That classification may provide helps in order to establish links between luminescence bands and defects.

Citation Download Citation

J. Fournier, J. Néauport, P. Grua, V. Jubera, E. Fargin, D. Talaga, and S. Jouannigot "Luminescence of different surface flaws in high purity silica glass under UV excitation", Proc. SPIE 8190, Laser-Induced Damage in Optical Materials: 2011, 819021 (28 November 2011); https://doi.org/10.1117/12.899177

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