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8 September 2011 The research of non-uniformity correction technologies for resistor array dynamic infrared scene projector
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Abstract
The resistor array devices are commonly used to produce dynamic two dimensional infrared images in the infrared scene projectors. A non-uniformity caused by many factors is the main source of image fixed pattern noise of the projectors based on resistor array devices. A prior non-uniformity correction procedure must be done before the dynamic infrared image generation for the hardware-in-the-loop simulation test and evaluation. In this paper, the developments and details of the non-uniformity correction technologies for resistor array dynamic infrared scene projector are investigated. The research is commenced directed towards understanding the cause of spatially-distributed radiance non-uniformities of resistor array device, and the fundamental elements that underlie the non-uniformity correction technologies in dynamic infrared scene projection system.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hong-ming Zhao, Jin-dong Fei, Hong Yu, Hui-jie Du, and Yi Zhang "The research of non-uniformity correction technologies for resistor array dynamic infrared scene projector", Proc. SPIE 8191, International Symposium on Photoelectronic Detection and Imaging 2011: Sensor and Micromachined Optical Device Technologies, 81911B (8 September 2011); https://doi.org/10.1117/12.900596
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