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22 August 2011 Imaging properties of the rotundity planar microlens array
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Abstract
We fabricated a single-layer rotundity PMLA with the photolithography and ion-exchanging technique whose parameters is developed in experiment. The theory show that the multiple imaging is obtained by both single-layer PMLA and double-layer PMLA while the comprehensive imaging is obtained only by double-layer PMLA. The imaging condition of comprehensive imaging for double-layer PMLA is analyzed that the magnification must be equal to 1 in this paper. The ray trajectory equation of PMLA is accord with rotation-symmetric model, and the paraxial optical properties of PMLA is obtained by ABCD law. At last, the location parameter of comprehensive imaging is obtained according to the imaging condition.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zhifang Zhao, Xiaomei Chen, Fengjun Zhang, Jie Chen, Sumei Zhou, Xiaoping Jiang, and Desen Liu "Imaging properties of the rotundity planar microlens array", Proc. SPIE 8192, International Symposium on Photoelectronic Detection and Imaging 2011: Laser Sensing and Imaging; and Biological and Medical Applications of Photonics Sensing and Imaging, 81923S (22 August 2011); https://doi.org/10.1117/12.901009
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