The research of the coupling of circuit and chip

Yang Wang; Honghui Yuan; Qinfei Xu

doi:10.1117/12.897275

8 September 2011 The research of the coupling of circuit and chip

Yang Wang, Honghui Yuan, Qinfei Xu

Proceedings Volume 8193, International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Infrared Imaging and Applications; 81930C (2011) https://doi.org/10.1117/12.897275
Event: International Symposium on Photoelectronic Detection and Imaging 2011, 2011, Beijing, China

Abstract

The paper mainly investigate the abnormal occurrence of no Photo current response at performance test of detector after coupling of circuit and chip. At the beginning, we find that detector module is out of the way, while preamplifier circuit and photosenstive chip operate well separately. Then we carry on various experiments such as I-V measurement of chip, simulated magnification test of circuit, replace of high resistence chip, at various background measurement and so on. All these experiments and theoretical calculation demonstrate that the large background dark current resulting in the circuit's overload is the cause of detector's no Photo current response. By means of adding optical filter and aperture slot to reduce the background radiation, consequently the reduction of background dark current, and the detector finally works well without the circuit's overload.

Citation Download Citation

Yang Wang, Honghui Yuan, and Qinfei Xu "The research of the coupling of circuit and chip", Proc. SPIE 8193, International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Infrared Imaging and Applications, 81930C (8 September 2011); https://doi.org/10.1117/12.897275

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