Paper
18 August 2011 XPS study on microporous surface composition of microchannel plates
Yonggang Huang, Yang Zhang, Hui Liu, Zhenan Gu
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Abstract
X-ray photoelectron spectroscopy (XPS) was used to study the microporous surface elements change in content and chemical states of microchannel plates before and after hydrogen reduction. The results show that the oxygen charge states include mixture of bridging oxygen (BO), non-bridging oxygen (NBO), and hydrogen oxide (-OH), and BO is the main charge state, that Si, Pb and Bi are also bonded with F to produce fluoride except bonding with oxygen before hydrogen reduction. After hydrogen reduction, the binding state of O and Si unchanged. The [BO] and [NBO] decrease, and [OH] increases obviously. Si fluoride reacts with H2O and produces amounts of ≡Si-O- at high temperature. The lead exists in mixture of Pb0 and Pb2+, and the Bi mainly exists in bond of Bi0 in surface region of the reduced samples. The signals of K2p and Na1s emerged again in the reduced samples. It is the change in content and chemical states of microchannel plates after hydrogen reducing processing that the secondary electron emission yield after reduction is 1.5 times higher than that of samples before reduction, and the bulk resistivity obviously drops by 3~4 order.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yonggang Huang, Yang Zhang, Hui Liu, and Zhenan Gu "XPS study on microporous surface composition of microchannel plates", Proc. SPIE 8194, International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Imaging Detectors and Applications, 81941Q (18 August 2011); https://doi.org/10.1117/12.900283
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Cited by 4 scholarly publications.
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KEYWORDS
Hydrogen

Microchannel plates

Lead

Chemical elements

Ions

Oxygen

Silicon

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