Paper
5 December 2011 The influence of graded InxGa1-xAs on strain distribution and the band gap in the InAs/GaAs quantum dots
Author Affiliations +
Proceedings Volume 8198, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Devices and Integration; 81980K (2011) https://doi.org/10.1117/12.921319
Event: International Conference on Optical Instruments and Technology (OIT2011), 2011, Beijing, Beijing, China
Abstract
The effect of the graded InxGa1-xAs layer on the distribution of the strain was studied by calculating the strain of different models using the finite element method. The results demonstrate that the graded InxGa1-xAs layer can reduce the strain and thus lead to longer emission wavelength. The results also demonstrate that the graded InxGa1-xAs layer can increase strain in the GaAs capping layer which cause disadvantage to grow stacked InAs/GaAs QD structure. But the strain can be released though increase the thickness of spacer layer when grow stacked structure.
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Jia Wang, Qi Wang, Xin Guo, Xiaomin Ren, Xia Zhang, and Yongqing Huang "The influence of graded InxGa1-xAs on strain distribution and the band gap in the InAs/GaAs quantum dots", Proc. SPIE 8198, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Devices and Integration, 81980K (5 December 2011); https://doi.org/10.1117/12.921319
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KEYWORDS
Indium arsenide

Quantum dots

Gallium arsenide

Crystals

Optical properties

Finite element methods

Indium

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