Comprehensive multi-wavelength laser simulated-testing techniques and application

Zhibin Chen; Mingxi Xue

doi:10.1117/12.904895

30 November 2011 Comprehensive multi-wavelength laser simulated-testing techniques and application

Zhibin Chen, Mingxi Xue

Proceedings Volume 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems; 82010F (2011) https://doi.org/10.1117/12.904895
Event: International Conference on Optical Instruments and Technology (OIT2011), 2011, Beijing, Beijing, China

Abstract

Receiving system for the laser equipment performance testing, although the use of laser simulation testing equipment can overcome the high cost of traditional methods equipment, strict environmental requirements on the venue and other issues. But in the practical application of various laser devices under test, wavelength and frequency are varies. So that laser simulation testing equipment requires a higher degree of comprehensive and intelligence. Therefore, we propose a new comprehensive multi-wavelength laser simulated-testing technology, and study the design and application of comprehensive laser simulated-testing instrument in the test of receiving system of laser equipment. Our design process in these devices there are two technical bottlenecks for us and we propose efficient solutions:(1)Complex structure of the optical system, the volume mass is too large; (2)Different wavelength laser firing unit with low degree of integration and the high cost of processing. The instrument has the advantage, the ability to easily and real-time test different wavelengths and frequency of laser devices to receiving system with a high degree of device comprehensive and low cost.

Citation Download Citation

Zhibin Chen and Mingxi Xue "Comprehensive multi-wavelength laser simulated-testing techniques and application", Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82010F (30 November 2011); https://doi.org/10.1117/12.904895

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available