Paper
2 February 1988 Modeling Refractive Index In Mixed Component Systems
Albert Feldman
Author Affiliations +
Abstract
The refractive index of an optical film composed of a mixture of more than one constituent is a function of the micro-structure of the film. Even films that are nominally of a single material have refractive index values that require interpretation on the basis of mixed component models because these values differ significantly from the values in equivalent bulk materials. In the latter case, the film is usually a mixture of bulk material and voids, or bulk material, voids, and adsorbed water. Many models have been used to explain the refractive indices of mixed component systems. The Lorentz-Lorenz model, the Drude model, and the effective media approximation (EMA or Bruggeman model) are the most common models used to estimate isotropic refractive indices of mixtures of isotropic materials. Films composed of anisotropic micro-structures, however, require other models such as the Bragg and Pippard model. One use of mixed component models would be to predict the porosity of optical films. Another would be to predict the refractive index of coevaporated films. However, no one model is applicable to all situations. Therefore, the prediction of refractive index becomes difficult. Usually, the model is chosen after the set of measurements has been done.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Albert Feldman "Modeling Refractive Index In Mixed Component Systems", Proc. SPIE 0821, Modeling of Optical Thin Films, (2 February 1988); https://doi.org/10.1117/12.941850
Lens.org Logo
CITATIONS
Cited by 10 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Refractive index

Systems modeling

Thin films

Chemical species

Data modeling

Zirconium dioxide

Silica

RELATED CONTENT

PLD of hard ceramic coatings
Proceedings of SPIE (June 29 2001)
Thin-Film Microstructure Modeling
Proceedings of SPIE (November 20 1985)
Behavior of microparticles in laser interference field
Proceedings of SPIE (October 11 2005)

Back to Top