Paper
8 February 2012 High performance diode lasers emitting at 780-820 nm
L. Bao, M. DeVito, M. Grimshaw, P. Leisher, H. Zhou, W. Dong, X. Guan, S. Zhang, R. Martinsen, J. Haden
Author Affiliations +
Abstract
High power 780-820 nm diode lasers have been developed for pumping and material processing systems. This paper presents recent progress in the development of such devices for use in high performance industrial applications. A newly released laser design in this wavelength range demonstrates thermally limited >25W CW power without catastrophic optical mirror damage (COMD), with peak wallplug efficiency ~65%. Ongoing accelerated lifetesting projects a time to 5% failure of ~10 years at 5 and 8 W operating powers for 95 and 200 μm emitter widths, respectively. Preliminary results indicate the presence and competition of a random and wear-out failure mode. Fiber-coupled modules based on arrays of these devices support >100W reliable operation, with a high 56% peak efficiency (ex-fiber) and improved brightness/reliability.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
L. Bao, M. DeVito, M. Grimshaw, P. Leisher, H. Zhou, W. Dong, X. Guan, S. Zhang, R. Martinsen, and J. Haden "High performance diode lasers emitting at 780-820 nm", Proc. SPIE 8241, High-Power Diode Laser Technology and Applications X, 824109 (8 February 2012); https://doi.org/10.1117/12.910321
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Cited by 5 scholarly publications.
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KEYWORDS
Reliability

Semiconductor lasers

Failure analysis

Continuous wave operation

Data modeling

Laser development

High power lasers

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