Paper
8 February 2012 High-efficiency high-brightness diode lasers at 1470 nm/1550 nm for medical and defense applications
Author Affiliations +
Abstract
Diode lasers in the 1400 nm to 1600 nm regime are used in a variety of applications including pumping Er:YAG lasers, range finding, materials processing, aesthetic medical treatments and surgery. In addition to the compact size, efficiency, and low cost advantages of traditional diode lasers, high power semiconductor lasers in the eye-safe regime are becoming widely used in an effort to minimize the unintended impact of potentially hazardous scattered optical radiation from the laser source, the optical delivery system, or the target itself. In this article we describe the performance of high efficiency high brightness InP laser bars at 1470nm and 1550nm developed at QPC Lasers for applications ranging from surgery to rangefinding.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kendra Gallup, Jeff Ungar, Laurent Vaissie, Rob Lammert, and Wentao Hu "High-efficiency high-brightness diode lasers at 1470 nm/1550 nm for medical and defense applications", Proc. SPIE 8241, High-Power Diode Laser Technology and Applications X, 82410R (8 February 2012); https://doi.org/10.1117/12.905274
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Semiconductor lasers

Laser therapeutics

Laser vision correction

Surgery

Laser applications

Defense and security

Laser development

RELATED CONTENT

A power scaled diode cladding pumped 2.8 µm Er ZBLAN...
Proceedings of SPIE (January 01 1900)
Laser therapy in general dental practice
Proceedings of SPIE (February 28 2006)
Medical applications of semiconductor lasers
Proceedings of SPIE (June 08 1994)
Laser marketplace overview
Proceedings of SPIE (May 05 1992)
Highly reliable high power cw AlGaAs (808 nm) 1 cm...
Proceedings of SPIE (April 10 1995)

Back to Top