Paper
15 February 2012 Coherence-gated wavefront sensing for microscopy using fringe analysis
Tim van Werkhoven, Hoa Truong, Jacopo Antonello, Rufus Fraanje, Hans Gerritsen, Michel Verhaegen, Christoph Keller
Author Affiliations +
Proceedings Volume 8253, MEMS Adaptive Optics VI; 82530E (2012) https://doi.org/10.1117/12.905797
Event: SPIE MOEMS-MEMS, 2012, San Francisco, California, United States
Abstract
We have implemented a coherence-gated wavefront sensor on a two-photon excitation microscope. We used the backscattered near-infrared light from the sample to interfere with an optically flat reference beam. By applying a known waverfront tilt in the reference beam, a fringe pattern emerged on the camera. The deformmation of the wavefront due to the turbid media under study warps the fring pattern, similar to frequency modulation. Through Fourier transform analysis of the modulated fringe pattern we were able to determine the wave fornt aberrations induced by synthetic and biological samples. By defocussing the microscope objective and measuring the wavefront deformation we established that the errors are reproduceible to within λ/227 for the defocus mode.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tim van Werkhoven, Hoa Truong, Jacopo Antonello, Rufus Fraanje, Hans Gerritsen, Michel Verhaegen, and Christoph Keller "Coherence-gated wavefront sensing for microscopy using fringe analysis", Proc. SPIE 8253, MEMS Adaptive Optics VI, 82530E (15 February 2012); https://doi.org/10.1117/12.905797
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CITATIONS
Cited by 3 scholarly publications.
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KEYWORDS
Fringe analysis

Wavefront sensors

Microscopy

Microscopes

Wavefronts

Adaptive optics

Cameras

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