Monte Carlo method for evaluation of uncertainty in topometry by using in-plane electronic speckle pattern interferometry with divergent illumination

Amalia Martínez; Jorge Parra-Michel; Raul Cordero; J. A. Rayas

doi:10.1117/12.911931

14 October 2011 Monte Carlo method for evaluation of uncertainty in topometry by using in-plane electronic speckle pattern interferometry with divergent illumination

Amalia Martínez, Jorge Parra-Michel, Raul Cordero, J. A. Rayas

Author Affiliations +

Proceedings Volume 8287, Eighth Symposium Optics in Industry; 82870G (2011) https://doi.org/10.1117/12.911931
Event: Eighth Symposium Optics in Industry, 2011, Toluca de Lerdo, Mexico

Abstract

Electronic speckle pattern interferometry is a useful technique in the measurement of displacement fields and topography. Traditionally, arrangement with dual collimated illumination to topography measurement is used. In this case, the object analysis is limited to the size of optical collimating lens. In the case of large objects, an optical system with divergent illumination can be used. It is known that displacement fields and the phase are related by the sensitivity vector. At once, to compute the sensitivity vector, illumination sources position and superficial shape need to be considered. The last condition becomes an impediment to surface contouring. In a published work¹, a simple iterative algorithm based on the Gauss-Seidel technique is presented to compute contouring measurement. In the present work, the uncertainty associated to the measurement of the topography is calculated by using the Monte Carlo method.

Citation Download Citation

Amalia Martínez, Jorge Parra-Michel, Raul Cordero, and J. A. Rayas "Monte Carlo method for evaluation of uncertainty in topometry by using in-plane electronic speckle pattern interferometry with divergent illumination", Proc. SPIE 8287, Eighth Symposium Optics in Industry, 82870G (14 October 2011); https://doi.org/10.1117/12.911931

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available