Paper
11 October 2011 Application of infrared ATR ellipsometry for measurement of solid samples: calibration procedure
Author Affiliations +
Proceedings Volume 8306, Photonics, Devices, and Systems V; 83060S (2011) https://doi.org/10.1117/12.914242
Event: Photonics Prague 2011, 2011, Prague, Czech Republic
Abstract
Attenuated total reflection (ATR) is widely used in infrared spectral range for measurement of surface properties of solid samples, powders, and liquids. In this paper we use a commercial Fourier-transform infrared (FTIR) spectrometer Vertex 70v from Bruker company equipped with the ATR Golden Gate accessory from Specac. To increase sensitivity of the method we included infrared polarizer and analyzer, which enable measurement of the reflected amplitudes ratio and the phase differences between p- and s-polarizations in the frame of the ATR ellipsometry. Procedure of ellipsometric angles measurement is proposed using data acquisition at several azimuthal angles of polarizers. Spectral dependence of real polarizer extinction ratio, partial polarization of beam coming from the interferometer and polarization sensitivity of infrared detector are presented.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zuzana Mrázková, David Hrabovský, Kamil Postava, and Jaromír Pištora "Application of infrared ATR ellipsometry for measurement of solid samples: calibration procedure", Proc. SPIE 8306, Photonics, Devices, and Systems V, 83060S (11 October 2011); https://doi.org/10.1117/12.914242
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KEYWORDS
Polarizers

Prisms

Calibration

Germanium

Infrared radiation

Sensors

Diamond

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