Paper
28 November 2011 Patterning effect mitigation using complementary data for NRZ wavelength conversion with a SOA-MZI
Gang Wang, Xuelin Yang, Qiwei Weng, Weisheng Hu
Author Affiliations +
Proceedings Volume 8308, Optoelectronic Materials and Devices VI; 83080F (2011) https://doi.org/10.1117/12.904084
Event: SPIE/OSA/IEEE Asia Communications and Photonics, 2011, Shanghai, China
Abstract
A novel scheme of Non-Return-to-Zero (NRZ) all-optical wavelength conversion is proposed using a semiconductor optical amplifier based Mach-Zehnder interferometer (SOA-MZI), where the complementary NRZ data is used to mitigate SOA patterning effect. The performances of the wavelength converters are numerically evaluated in terms of the waveform, eye-diagram and Q factor of the output signals at 40 Gb/s, using a time-domain SOA model. It is shown that the new complementary scheme significantly improves the Q factor of the converted signal from 3.8 to 8.1, compared with the traditional scheme.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gang Wang, Xuelin Yang, Qiwei Weng, and Weisheng Hu "Patterning effect mitigation using complementary data for NRZ wavelength conversion with a SOA-MZI", Proc. SPIE 8308, Optoelectronic Materials and Devices VI, 83080F (28 November 2011); https://doi.org/10.1117/12.904084
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KEYWORDS
Data conversion

Optical lithography

Semiconductor optical amplifiers

Wavelength division multiplexing

Mach-Zehnder interferometers

Modulation

Optical data conversion

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