Absolute distance measurement applying spectrally-resolved interferometry

Wei-hu Zhou; Yan Xu; Lei Ding

doi:10.1117/12.903718

15 November 2011 Absolute distance measurement applying spectrally-resolved interferometry

Wei-hu Zhou, Yan Xu, Lei Ding

Proceedings Volume 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation; 83210H (2011) https://doi.org/10.1117/12.903718
Event: Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 2011, Yunnan, China

Abstract

A scheme is proposed for high-precision, absolute distance measurement for a theoretical arbitrary optical distance. The approach utilizes a frequency stabilized Ti:sapphirez femtosecond pulse laser to provide a phase-locked summation of discrete quasi-monochromatic light modes of consecutive frequencies, which is seen as an optical comb in the frequency domain. We describe a new way of spectrally-resolved interferometry devised to measure the optical path delay between two consecutive ultrashort pulses with high precision, which leads to an accurate means of absolute distance measurement. A FPE(Fabry-Perot Etalon) filters smaller frequency from the broad-bandwidth femtosecond laser pulse produced. The dispersive interferometry data permits the unambiguous measurement range to be significantly increased compared with the dispersive interferometry used in white light to measure an absolute distance. Preliminary experimental results are reported for a spectrally-resolved interferometry demonstrating the principle of operation and yielding a non-ambiguity range of 5.75 mm and an associated resolution of nanometer level.

Citation Download Citation

Wei-hu Zhou, Yan Xu, and Lei Ding "Absolute distance measurement applying spectrally-resolved interferometry", Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83210H (15 November 2011); https://doi.org/10.1117/12.903718

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