Paper
20 March 2012 Synthesis of stable acid amplifiers that produce strong highly-fluorinated polymer-bound acid
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Abstract
A novel series of stable, acid amplifiers (AAs) has been designed and tested for use in Extreme Ultraviolet (EUV) lithography, that generate strong, fluorinated polymer bound sulfonic acids. Novel polymer bound and blended AAs were prepared in moderate to good yields and characterized by NMR. We demonstrated by EUV lithography that the polymer bound AA resist has line-edge roughness (LER) values of 3.8 nm and the polymer blended AA resist has LER values of 2.1 nm while the control resist has LER values of 4.6 nm. Although sensitivity comparisons have yet to be made, these new resists using bound and blended AAs are showing remarkable improvements in LER when compared with the control resist without AAs.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kenji Hosoi, Brian Cardineau, William Earley, Seth Kruger, Koichi Miyauchi, and Robert Brainard "Synthesis of stable acid amplifiers that produce strong highly-fluorinated polymer-bound acid", Proc. SPIE 8325, Advances in Resist Materials and Processing Technology XXIX, 83251S (20 March 2012); https://doi.org/10.1117/12.917018
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Cited by 8 scholarly publications and 1 patent.
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KEYWORDS
Polymers

Amplifiers

Line edge roughness

Extreme ultraviolet lithography

Extreme ultraviolet

Diffusion

Lithography

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