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18 May 2012 Testing of infrared image enhancing algorithm in different spectral bands
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The paper presents results of testing the infrared image quality enhancing algorithm based on histogram processing. Testing were performed on real images registered in NIR, MWIR, and LWIR spectral bands. Infrared images are a very specific type of information. The perception and interpretation of such image depends not only on radiative properties of observed objects and surrounding scenery. Probably still most important are skills and experience of an observer itself. In practice, the optimal settings of the camera as well as automatic temperature range or contrast control do not guarantee the displayed images are optimal from observer's point of view. The solution to this are algorithms of image quality enhancing based on digital image processing methods. Such algorithms can be implemented inside the camera or applied later, after image registration. They must improve the visibility of low-contrast objects. They should also provide effective dynamic contrast control not only across entire image but also selectively to specific areas in order to maintain optimal visualization of observed scenery. In the paper one histogram equalization algorithm was tested. Adaptive nature of the algorithm should assure significant improvement of the image quality and the same effectiveness of object detection. Another requirement and difficulty is that it should also be effective for any given thermal image and it should not cause a visible image degradation in unpredictable situations. The application of tested algorithm is a promising alternative to a very effective but complex algorithms due to its low complexity and real time operation.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. Dulski, T. Sosnowski, M. Kastek, and P. Trzaskawka "Testing of infrared image enhancing algorithm in different spectral bands", Proc. SPIE 8355, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIII, 83551F (18 May 2012);

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