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10 May 2012 Pixelated diffraction signatures for explosive detection
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Energy dispersive X-ray diffraction (EDXRD) is a technique which can be used to improve the detection and characterisation of explosive materials. This study has performed EDXRD measurements of various explosive compounds using a novel, X-ray sensitive, pixelated, energy resolving detector developed at the Rutherford Appleton Laboratory, UK (RAL). EDXRD measurements are normally performed at a fixed scattering angle, but the 80×80 pixel detector makes it possible to collect both spatially resolved and energy resolved data simultaneously. The detector material used is Cadmium Telluride (CdTe), which can be utilised at room temperature and gives excellent spectral resolution. The setup uses characteristics from both energy dispersive and angular dispersive scattering techniques to optimise specificity and speed. The purpose of the study is to develop X-ray pattern "footprints" of explosive materials based on spatial and energy resolved diffraction data, which can then be used for the identification of such materials hidden inside packages or baggage. The RAL detector is the first energy resolving pixelated detector capable of providing an energy resolution of 1.0-1.5% at energies up to 150 keV. The benefit of using this device in a baggage scanner would be the provision of highly specific signatures to a range of explosive materials. We have measured diffraction profiles of five explosives and other compounds used to make explosive materials. High resolution spectra have been obtained. Results are presented to show the specificity of the technique in finding explosives within baggage.
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Daniel O'Flynn, Caroline Reid, Christiana Christodoulou, Matt Wilson, Matthew C. Veale, Paul Seller, and Robert Speller "Pixelated diffraction signatures for explosive detection", Proc. SPIE 8357, Detection and Sensing of Mines, Explosive Objects, and Obscured Targets XVII, 83570X (10 May 2012);

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