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3 May 2012 Standard method for characterizing SERS substrates
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We present the methodology and results of a standard assessment protocol to evaluate disparate SERS substrates that were developed for the Defense Advanced Research Programs Agency (DARPA) SERS Science and Technology Fundamentals Program. The results presented are a snapshot of a collaborative effort between the US Army Edgewood Chemical Biological Center, and the US Army Research Laboratory-Aldelphi Laboratory Center to develop a quantitative analytical method with spectroscopic figures of merit to unambiguously compare the sensitivity and reproducibility of various SERS substrates submitted by the program participants. We present the design of a common assessment protocol and the definition of a SERS enhancement value (SEV) in order to effectively compare SERS active surfaces.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jason A. Guicheteau, Mikella E. Hankus, Steven D. Christesen, Augustus Way Fountain III, Paul M. Pellegrino, Erik D. Emmons, Ashish Tripathi, Phillip Wilcox, and Darren Emge "Standard method for characterizing SERS substrates", Proc. SPIE 8373, Micro- and Nanotechnology Sensors, Systems, and Applications IV, 837320 (3 May 2012);

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