Negative refraction characterization in one-dimensional photonic crystals

R. Doti; J. E. Lugo; J. Faubert

doi:10.1117/12.2001448

24 October 2012 Negative refraction characterization in one-dimensional photonic crystals

R. Doti, J. E. Lugo, J. Faubert

Proceedings Volume 8412, Photonics North 2012; 84121V (2012) https://doi.org/10.1117/12.2001448
Event: Photonics North 2012, 2012, Montréal, Canada

Abstract

In this work we present two experiments as evidence of negative refraction in one dimensional photonics crystals (1D PC). Particularly the porous silicon (p-Si) multilayer structure is used as 1D PC since this structure presents periodic dielectric components with specific refraction indexes and under certain conditions it can abnormally refract the light. In the first experiment we show the negative refraction for two different wavelengths, one in the visible, and the other in the infrared regions of the spectrum. In this experiment we use a fixed incidence angle for a conditioned white light beam and we look for the emerging negative refracted beam. In the second experiment we characterize de negative refraction observed for the same material by varying the incidence angle in a wide range. The obtained results are compared with a theoretic prediction according a model proposed by the authors [1]. We present a brief description of the material production and its properties, as well.

Citation Download Citation

R. Doti, J. E. Lugo, and J. Faubert "Negative refraction characterization in one-dimensional photonic crystals", Proc. SPIE 8412, Photonics North 2012, 84121V (24 October 2012); https://doi.org/10.1117/12.2001448

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KEYWORDS

Negative refraction

Photonic crystals

Silicon

Refractive index

Crystals

Interfaces

Cameras

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