Development of a portable ESPI system for the analysis in situ of mural paintings

E. Boaglio; J. Lamas; Ana J. López; A. Ramil; L. Pereira; B. Prieto; B. Silva

doi:10.1117/12.978263

11 September 2012 Development of a portable ESPI system for the analysis in situ of mural paintings

E. Boaglio, J. Lamas, Ana J. López, A. Ramil, L. Pereira, B. Prieto, B. Silva

Proceedings Volume 8413, Speckle 2012: V International Conference on Speckle Metrology; 841314 (2012) https://doi.org/10.1117/12.978263
Event: SPECKLE 2012: V International Conference on Speckle Metrology, 2012, Vigo, Spain

Abstract

The use of Electronic Speckle Pattern Interferometry (ESPI) is well documented in the literature as a non-destructive technique for structural diagnostics in the field of cultural heritage.. In the case of mural paintings the lack of adhesion between the plaster and the mural support is one of the most important risk factors that threaten their conservation. With this non-invasive method it is possible to detect detachments and cracks in the paintings before they become visible The objective of this work is the development of ESPI portable equipment based on a fibre interferometer for in situ qualitative analysis of mural paintings. The novelty of the presented set up is the use of a variable ratio coupler which makes the system more immune to vibrations and allows for better use of available light compared with the equivalent of free air guided. This configuration simplifies the arrangement and makes it possible to obtain ESPI interferograms with high contrast; moreover, the use of a ceramic heater as excitation source enables the analysis during the heating. Preliminary results obtained in laboratory conditions have shown that detachments and cracks can be successfully detected on model samples of the wall paintings.

Citation Download Citation

E. Boaglio, J. Lamas, Ana J. López, A. Ramil, L. Pereira, B. Prieto, and B. Silva "Development of a portable ESPI system for the analysis in situ of mural paintings", Proc. SPIE 8413, Speckle 2012: V International Conference on Speckle Metrology, 841314 (11 September 2012); https://doi.org/10.1117/12.978263

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available