New method for measuring the laser-induced damage threshold of optical thin film

Jun-hong Su; Hong Wang; Ying-xue Xi

doi:10.1117/12.975932

15 October 2012 New method for measuring the laser-induced damage threshold of optical thin film

Jun-hong Su, Hong Wang, Ying-xue Xi

Proceedings Volume 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 84170U (2012) https://doi.org/10.1117/12.975932
Event: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012), 2012, Xiamen, China

Abstract

The laser-induced damage threshold (LIDT) of thin film means that the thin film can withstand a maximum intensity of laser radiation. The film will be damaged when the irradiation under high laser intensity is greater than the value of LIDT. In this paper, an experimental platform with measurement operator interfaces and control procedures in the VB circumstance is built according to ISO11254-1. In order to obtain more accurate results than that with manual measurement, in the software system, a hardware device can be controlled by control widget on the operator interfaces. According to the sample characteristic, critical parameters of the LIDT measurement system such as spot diameter, damage threshold region, and critical damage pixel number are set up on the man-machine conversation interface, which could realize intelligent measurements of the LIDT. According to experimental data, the LIDT is obtained by fitting damage curve automatically.

Citation Download Citation

Jun-hong Su, Hong Wang, and Ying-xue Xi "New method for measuring the laser-induced damage threshold of optical thin film", Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 84170U (15 October 2012); https://doi.org/10.1117/12.975932

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