Paper
15 October 2012 Effect of annealing on optical properties and structure of the vanadium dioxide thin films
Huiqun Zhu, Yi Li, Yuming Li, Yize Huang, Guoxiang Tong, Baoying Fang, Qiuxin Zheng, Liu Li, Yujian Shen
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Abstract
VO2 thin films were prepared on soda-lime glass substrates by DC magnetron sputtering at room temperature using vanadium target and post annealing in air. X-ray diffraction and FTIR spectroscopy analyses showed that the films obtained at the optimized parameters have high VO2 (011) orientation. Both low temperature deposition and post annealing method were beneficial to grow the nano-films with pure VO2 phase-structure and composition. Metalinsulator transition properties of the VO2 films in terms of infrared transmittance, transmittance variation and film thickness were investigated under varying annealing temperature. Results showed that infrared transmittance variation and transition temperature of the nano-films were significantly improved and reduced respectively. Therefore, this study was able to develop practical low-cost preparation methods for high-performance intelligent energy-saving thin films.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Huiqun Zhu, Yi Li, Yuming Li, Yize Huang, Guoxiang Tong, Baoying Fang, Qiuxin Zheng, Liu Li, and Yujian Shen "Effect of annealing on optical properties and structure of the vanadium dioxide thin films", Proc. SPIE 8418, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Smart Structures, Micro- and Nano-Optical Devices, and Systems, 84181S (15 October 2012); https://doi.org/10.1117/12.978622
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Cited by 3 scholarly publications.
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KEYWORDS
Annealing

Transmittance

Infrared radiation

Thin films

Vanadium

FT-IR spectroscopy

Reflectivity

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