Design for the correction system of the real time nonuniformity of large area-array CCD image

Yan Wang; Chunmei Li; Ning Lei

doi:10.1117/12.977227

15 October 2012 Design for the correction system of the real time nonuniformity of large area-array CCD image

Yan Wang, Chunmei Li, Ning Lei

Proceedings Volume 8419, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy; 84191R (2012) https://doi.org/10.1117/12.977227
Event: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012), 2012, Xiamen, China

Abstract

With the robust thriving of aviation cameras and remote sensing technology, the linear-array CCD (charge-coupled device) and area CCD have developed toward large area CCD, which has a broad coverage and avoids the difficulty in jointing small area CCDs in addition to improving time resolution. However, due to the high amount of pixels and channels of large area CCD, photo-response non-uniformity (PRNU) is severe. In this paper, a real time non-uniformity correction system is introduced for a sort of large area full frame transfer CCD. First, the correction algorithm is elaborated according to CCD’s working principle. Secondly, due to the high number of pixels and correction coefficient, ordinary chip memory cannot meet the requirement. The combination of external flash memory and DDR described in the paper satisfies large capacity memory and rapid real time correction. The methods and measurement steps for obtaining correction factors are provided simultaneously. At the end, an imaging test is made. The non-uniformity of the image is reduced to 0.38 % from the pre-correction 2.96 %, achieving an obvious reduction of non-uniformity. The result shows that the real time non-uniformity correction system can meet the demands of large area-array CCD.

Citation Download Citation

Yan Wang, Chunmei Li, and Ning Lei "Design for the correction system of the real time nonuniformity of large area-array CCD image", Proc. SPIE 8419, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy, 84191R (15 October 2012); https://doi.org/10.1117/12.977227

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