Research on voltage characteristic of the third generation low-light-level image intensifier tube's output signal to noise ratio

Xiaofeng Bai; Lei Yin; Wen Hu; Feng Shi; Zhipeng Hou; Hongli Shi; Yingping He

doi:10.1117/12.975774

15 October 2012 Research on voltage characteristic of the third generation low-light-level image intensifier tube's output signal to noise ratio

Xiaofeng Bai, Lei Yin, Wen Hu, Feng Shi, Zhipeng Hou, Hongli Shi, Yingping He

Author Affiliations +

Proceedings Volume 8419, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy; 84192X (2012) https://doi.org/10.1117/12.975774
Event: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012), 2012, Xiamen, China

Abstract

Signal to noise ratio is an important parameter to evaluate the 3rd generation low-light-level image intensifier. In this article, voltage in different poles have been changed respectively, output signal to noise ratio referring to different voltages have been studied, and the relationship between each voltage and output signal to noise ratio has been analyzed. The study results show that voltage of photocathode is not less than 150 V, voltage of MCP is between 800 V and 900 V, and voltage of screen is between 5000 V and 6000 V while output signal to noise ratio of filmed image intensifier is optimized. The study in this article is worthwhile for developing signal to noise ratio of the 3^rd low-light-level image intensifier sufficiently.

Citation Download Citation

Xiaofeng Bai, Lei Yin, Wen Hu, Feng Shi, Zhipeng Hou, Hongli Shi, and Yingping He "Research on voltage characteristic of the third generation low-light-level image intensifier tube's output signal to noise ratio", Proc. SPIE 8419, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy, 84192X (15 October 2012); https://doi.org/10.1117/12.975774

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available