High-Power Semiconductor Diode Lasers : Reliability Data And Lifetest Methodology

Dilip K. Paul

doi:10.1117/12.968180

1 January 1987 High-Power Semiconductor Diode Lasers : Reliability Data And Lifetest Methodology

Dilip K. Paul

Proceedings Volume 0842, Fiber Optics Reliability: Benign and Adverse Environments; (1987) https://doi.org/10.1117/12.968180
Event: Cambridge Symposium on Fiber Optics and Integrated Optoelectronics, 1987, Cambridge, MA, United States

Abstract

This paper summarizes the development of high-power semiconductor diode lasers. Both structural and material considerations, and lifetest methodology appropriate for the high power devices are discussed. Also included are the lifetest data of representative state-of-the-art high-power diode lasers.

Citation Download Citation

Dilip K. Paul "High-Power Semiconductor Diode Lasers : Reliability Data And Lifetest Methodology", Proc. SPIE 0842, Fiber Optics Reliability: Benign and Adverse Environments, (1 January 1987); https://doi.org/10.1117/12.968180

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