Paper
17 October 2012 Ultra-high resolution real-time optical fiber strain sensor using a sideband interrogation method
Qingwen Liu, Tomochika Tokunaga, Zuyuan He
Author Affiliations +
Proceedings Volume 8421, OFS2012 22nd International Conference on Optical Fiber Sensors; 84214Q (2012) https://doi.org/10.1117/12.974969
Event: OFS2012 22nd International Conference on Optical Fiber Sensor, 2012, Beijing, China
Abstract
We report a novel sideband interrogation method to measure the resonance frequency difference between optical resonators. The laser carrier and a special designed sideband are simultaneously locked to the resonance frequencies of two sensor heads, respectively. Based on this method, an ultra-high resolution optical fiber real-time strain sensor system is built using a pair of identical fiber Fabry-Perot interferometers. A strain resolution of 0.05 nano-strain is demonstrated experimentally, and the measuring frequency is 7 Hz.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Qingwen Liu, Tomochika Tokunaga, and Zuyuan He "Ultra-high resolution real-time optical fiber strain sensor using a sideband interrogation method", Proc. SPIE 8421, OFS2012 22nd International Conference on Optical Fiber Sensors, 84214Q (17 October 2012); https://doi.org/10.1117/12.974969
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KEYWORDS
Sensors

Optical resolution

Modulators

Modulation

Optical fibers

Phase modulation

Fiber optics sensors

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