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11 May 2012 High-precision measurements of reflectance, transmittance, and scattering at 632.8 nm
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Progresses in the optical coatings and optical material fields require an increase in the sensitivity and accuracy of the optical parameters' measurement methods and systems. In this work we describe a flexible and high-accuracy system for measuring the main optical characteristics at 632.8 nm wavelength. The system comprises two methods: a laser ratio-metric measurement method for absolute measurement of the transmittance and the specular reflectance, and an integrating-sphere method for assessment of the total integrated scattering. The system utilizes an intensity stabilized He- Ne laser as a light source. Two four-element trap detectors are used: the first for monitoring of laser power, the second (fixed on a motorized stage) for the measurement of reflectance and transmittance, one after another. A PMT mounted to the exit port of a 40 cm diameter integrating hemisphere, is used for measuring the total integrated scattering. A series of measurements with several reference mirrors showed that the system is able to measure the specular reflectance with a reproducibility of <0.005%, transmittance of 0.005% with a reproducibility <0.005%, and total integrated scattering about 10 ppm, with a reproducibility of < 5 ppm at 2 sigma. The system allows characterizing of optical components with diameters between 5 mm and 50 mm.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Humbat Nasibov, Izmir Mamedbeili, Dadash Riza, Ertan Balaban, and Fikret Hacizade "High-precision measurements of reflectance, transmittance, and scattering at 632.8 nm", Proc. SPIE 8433, Laser Sources and Applications, 843313 (11 May 2012);


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