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9 May 2012 Optoectronic phase noise measurement system with wideband analysis
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Abstract
The use of a shorter delay line in a optoelectronic phase noise measurement system working in X-band, allow a characterization of the phase noise far from the carrier. Fourier frequency analysis can be extended from 105 to 2.106 Hz by introducing a 100 m delay line in addition of a 2 km optical fiber.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Patrice Salzenstein, Abdelhamid Hmima, Mikhail Zarubin, Ekaterina Pavlyuchenko, and Nathalie Cholley "Optoectronic phase noise measurement system with wideband analysis", Proc. SPIE 8439, Optical Sensing and Detection II, 84391M (9 May 2012); https://doi.org/10.1117/12.921630
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