Paper
29 June 2012 Loss free mask production with inspection, repair, and pellicle handling systems
Makoto Yonezawa, Tosho Cho, Makoto Takano, Masahiro Toriguchi, Masafumi Shinoda, Mitsuru Hamakawa, Seiki Matsumoto
Author Affiliations +
Abstract
Un-repairable defects cause not only delivery delay but also un-negligible loss cost in Large Size Photo Mask (LSPM) Productions. In order to avoid such loss, Lasertec provides various types of inspection and repair systems. The Large Size Substrate inspection system LB79 works for qualifying substrates for LSPMs. In a LSPM maker, the resist coated blanks can be inspected with LIR79i, the In-process Inspection and Repair system. ADI (After Develop Inspection) also can be performed with the same LIR79i as well as Resist Pattern Repairs with the Laser shots and the ink dispensing.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Makoto Yonezawa, Tosho Cho, Makoto Takano, Masahiro Toriguchi, Masafumi Shinoda, Mitsuru Hamakawa, and Seiki Matsumoto "Loss free mask production with inspection, repair, and pellicle handling systems", Proc. SPIE 8441, Photomask and Next-Generation Lithography Mask Technology XIX, 84410P (29 June 2012); https://doi.org/10.1117/12.970391
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KEYWORDS
Inspection

Pellicles

Particles

Head

Quartz

Cameras

Defect detection

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