An integrated 1-5 micron test bench for the characterization of cryogenic optical elements

Udo J. Wehmeier; Jarron Leisenring; Olivier Durney; Elliott Solheid; Gerard A. Luppino; Michael R. Meyer

doi:10.1117/12.927066

24 September 2012 An integrated 1-5 micron test bench for the characterization of cryogenic optical elements

Udo J. Wehmeier, Jarron Leisenring, Olivier Durney, Elliott Solheid, Gerard A. Luppino, Michael R. Meyer

Proceedings Volume 8446, Ground-based and Airborne Instrumentation for Astronomy IV; 84463G (2012) https://doi.org/10.1117/12.927066
Event: SPIE Astronomical Telescopes + Instrumentation, 2012, Amsterdam, Netherlands

Abstract

We report on the final design and current status of a 1-5 micron infrared test bench at the ETH Zurich Institute for Astronomy. This facility will enable us to characterize infrared optics, both reflective and transmissive, at cryogenic operating temperatures for both ground- and space-based applications. A focus of our lab is to facilitate the detection and characterization of extra-solar planets. The test bench is designed to characterize a range of spectrally dispersive and diffraction suppression optics such as filters, grisms, gratings, as well as both focal and pupil plane coronagraphs. The test bench is built around a 2048x2048 HAWAII-2RG detector from Teledyne Imaging Systems. The optical bench is envisioned to operate down to 30 K. “First light” is expected in the second half of 2012. We outline the status of the project, and describe the capabilities of the test bench in detail in order to alert potential collaborators to this new capability.

Citation Download Citation

Udo J. Wehmeier, Jarron Leisenring, Olivier Durney, Elliott Solheid, Gerard A. Luppino, and Michael R. Meyer "An integrated 1-5 micron test bench for the characterization of cryogenic optical elements", Proc. SPIE 8446, Ground-based and Airborne Instrumentation for Astronomy IV, 84463G (24 September 2012); https://doi.org/10.1117/12.927066

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