Applications of absolute surface metrology by transverse shifting

E. E. Bloemhof

doi:10.1117/12.927202

13 September 2012 Applications of absolute surface metrology by transverse shifting

E. E. Bloemhof

Proceedings Volume 8447, Adaptive Optics Systems III; 84476M (2012) https://doi.org/10.1117/12.927202
Event: SPIE Astronomical Telescopes + Instrumentation, 2012, Amsterdam, Netherlands

Abstract

A novel and very simple technique has been developed for extracting absolute phase maps from laboratory Fizeau interferometers, and that technique is generalized here to applications in interferometry and adaptive optics. In the original implementation, the phase maps considered were those produced by an interferometer measuring the surface of a high-precision flat mirror. The phase or surface shape measured in such a configuration is known only with respect to the phase map of the interferometer's transmission flat, and so contains substantial errors when precise surfaces are being tested. By making two additional measurements with small lateral shifts of the surface under test, and differencing these, maps of absolute phase differences between neighboring points on the test surface can be made. From these, standard wavefront reconstruction can recover an absolute phase map. Examples of the technique are considered here, including a novel diagnostic of common-path errors in adaptive optics systems. For an architecture in which the common path and the wavefront-sensor path can be adjusted in relative shear, it is possible to apply the requisite transverse shifts and so derive an absolute phase map isolating embedded portions of the system optics.

Citation Download Citation

E. E. Bloemhof "Applications of absolute surface metrology by transverse shifting", Proc. SPIE 8447, Adaptive Optics Systems III, 84476M (13 September 2012); https://doi.org/10.1117/12.927202

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