Paper
25 September 2012 Beating the 1/f noise limit on charge coupled devices
Juan Estrada, Gustavo Cancelo, Tom Diehl, Guillermo Fernandez-Moroni
Author Affiliations +
Abstract
Scientific CCD detectors are typically readout using the Correlated Double Sampling (CDS) technique. At low pixel rates, noise of ~2e- RMS is typically achieved. The limitation for reaching lower noise comes from the 1/f component on the output of the CCD, and this noise cannot be eliminated using CDS. A new readout technique based on a digital filter is presented here for suppressing the 1/f. Using this new technique a noise of 0.4e- is achieved.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Juan Estrada, Gustavo Cancelo, Tom Diehl, and Guillermo Fernandez-Moroni "Beating the 1/f noise limit on charge coupled devices", Proc. SPIE 8453, High Energy, Optical, and Infrared Detectors for Astronomy V, 84531E (25 September 2012); https://doi.org/10.1117/12.925983
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Charge-coupled devices

Cadmium sulfide

Video

Interference (communication)

Signal to noise ratio

Sensors

Clocks

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